Charge Density Wave bending observed by Xfel source acting as a tunable electronic lens for hard x-rays
E. BellecD. GhoneimA. GalloV.L.R. JacquesI. Gonzalez-VallejoL. OrtegaM. CholletA. SinchenkoD. Le Bolloc'h
E. BellecD. GhoneimA. Gallo
...+5
D. Le Bolloc'h
Sep 2023
0被引用
0笔记
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摘要原文
Ultrafast X-ray diffraction by the LCLS free-electron laser has been used to probe Charge Density Wave (CDW) systems under applied external currents. At sufficiently low currents, CDW wavefronts bend in the direction transverse to the 2k$_F$ wave vector. We show that this shear effect has the ability to focus or defocus hard X-ray beams, depending of the current direction, making it an electronic lens of a new kind, tunable at will from the Fraunhofer to the Fresnel regime. The effect is interpreted using the fractional Fourier transform showing how the macroscopic curvature of a nanometric modulation can be beneficially used to modify the propagation of X-ray beams.
